• Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Critical Dimension (Overhang)
  • Number of Cantilevers: 1個(gè)懸臂
    F350KHz K35N/m L125um
AFM探針描述

適用的Sample:
Data Storage,Semiconductors

適用的AFM機(jī)型:
Insight

適用的Work Mode:
Critical Dimension (CD) AFM

適用的Application:
Holes/ Trenches

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry Critical Dimension (Overhang)
tip radius (Nom) --
tip height 14-16um
Front Angle (FA) 10±2°
Back Angle (BA) 10 ±2°
Side Angle (SA) 10 ±2°
Overhang 5-15nm
Effective Length 250-350nm
Tip Width 80-100nm
Vertical Edge Height <10nm
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 35N/m
Frequency(Nom) 350KHz
length(Nom) 125um
thickness(Nom) 4um
cantilever material 0.01 - 0.02Ωcm Antimony (n) doped Si
top layer back 40 ±10 nm of Al
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比
探針型號(hào)對(duì)比
添加型號(hào)