CDR120C
- Manufacturer: Bruker
- Cantilever Coating: B: Reflective Aluminum,F: Wear resistant carbon
- Tip Geometry: Critical Dimension (Overhang)
-
Number of Cantilevers: 1個(gè)懸臂
F292KHz K35N/m L125um
AFM探針描述
適用的Sample:
Data Storage,Semiconductors
適用的AFM機(jī)型:
Insight
適用的Work Mode:
Critical Dimension (CD) AFM
適用的Application:
Holes/ Trenches
Coating 描述
cantilever Front side coating | |
---|---|
cantilever Back side coating | Reflective Aluminum |
tip coating | Carbon Coated |
Tip 規(guī)格
tip geometry | Critical Dimension (Overhang) |
---|---|
tip radius (Nom) | -- |
tip height | 10-20um |
Overhang | 5-15nm |
Effective Length | 500-700nm |
Tip Width | 100-130nm |
Cantilever 規(guī)格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 35N/m |
Frequency(Nom) | 292KHz |
length(Nom) | 125um |
thickness(Nom) | 3.3um |
cantilever material | 0.010 - 0.025 Ωcm Silicon |
top layer back | -- |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比