AFM探針描述
適用的Sample:
Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
適用的Work Mode:
CAFM,EFM,Electrical Spectroscopy,KPFM,PFM,SSRM,TUNA
適用的Application:
Electrical
Coating 描述
cantilever Front side coating | |
---|---|
cantilever Back side coating | Reflective PtIr |
tip coating | Conductive PtIr |
Tip 規(guī)格
tip geometry | Standard (Steep) |
---|---|
tip radius (Nom) | 25nm |
tip height | 10-15um |
Front Angle (FA) | 25±2.5° |
Back Angle (BA) | 15±2.5° |
Side Angle (SA) | 22.5±2.5° |
Cantilever 規(guī)格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 0.2N/m |
Frequency(Nom) | 13KHz |
length(Nom) | 450um |
thickness(Nom) | 2um |
cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
top layer back | -- |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum