• Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum,F: Conductive Diamond
  • Tip Geometry: Standard (Steep)
  • Number of Cantilevers: 1個(gè)懸臂
    F450KHz K80N/m L125um
AFM探針描述

適用的Sample:
Ceramics,Data Storage,Other Hard Samples,Polymers,Semiconductors

適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker

適用的Work Mode:
EFM,Electrical Spectroscopy,KPFM,PFM,SSRM

適用的Application:
Electrical

Coating 描述
cantilever Front side coating Conductive Diamond
cantilever Back side coating Reflective Aluminum
tip coating Conductive Diamond
Tip 規(guī)格
tip geometry Standard (Steep)
tip radius (Nom) 100nm
tip height 10-15um
Front Angle (FA) 25±2.5°
Back Angle (BA) 17.5±2.5°
Side Angle (SA) 20±2.5°
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 80N/m
Frequency(Nom) 450KHz
length(Nom) 125um
thickness(Nom) 3.6um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比
探針型號(hào)對(duì)比