DDLTESP-V2
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum,F: Conductive Diamond
  • Tip Geometry: Standard
  • Number of Cantilevers: 1個(gè)懸臂
    F280KHz K95N/m L225um
AFM探針描述

適用的Sample:

適用的AFM機(jī)型:
DimensionIcon

適用的Work Mode:
CAFM,contact resonance,PeakForce TUNA,PFM,SCM,SSRM

適用的Application:
Electrical,Mechanical Force Curves,Mechanical Property Mapping

Coating 描述
cantilever Front side coating Conductive Diamond
cantilever Back side coating Reflective Aluminum
tip coating Conductive Diamond
Tip 規(guī)格
tip geometry Standard
tip radius (Nom) 100nm
tip height 10-15um
Front Angle (FA) 25±2°
Back Angle (BA) 15±2°
Side Angle (SA) 17.5±2°
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 95N/m
Frequency(Nom) 280KHz
length(Nom) 225um
thickness(Nom) 7um
cantilever material Silicon
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比
探針型號(hào)對(duì)比
開始對(duì)比 最多4個(gè)
清空