EBD-CDR50
- Manufacturer: Bruker
- Cantilever Coating: B: Reflective Aluminum
- Tip Geometry: Critical Dimension (Overhang)
-
Number of Cantilevers: 1個(gè)懸臂
F300KHz K40N/m L125um
AFM探針描述
適用的Sample:
Semiconductors
適用的AFM機(jī)型:
Insight
適用的Work Mode:
Critical Dimension (CD) AFM,Deep Trench (DT)
適用的Application:
Holes/ Trenches
Coating 描述
cantilever Back side coating | Reflective Aluminum |
---|---|
tip coating | -- |
Tip 規(guī)格
tip geometry | Critical Dimension (Overhang) |
---|---|
tip radius (Nom) | 50nm |
tip height | 10-15um |
Overhang | 5-10nm |
Effective Length | 200-250nm |
Vertical Edge Height | <15nm |
Cantilever 規(guī)格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 40N/m |
Frequency(Nom) | 300KHz |
length(Nom) | 125um |
thickness(Nom) | 3.75um |
cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
top layer back | 40 ±10 nm of Al |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比