AFM探針描述
適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers
適用的AFM機型:
DimensionFastScan
適用的Work Mode:
FAST SCAN
適用的Application:
General Topography
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 規(guī)格
| tip geometry | Rotated (Symmetric) |
|---|---|
| tip radius (Nom) | 5nm |
| tip height | 2.5-8.0um |
| Front Angle (FA) | 15±2.5° |
| Back Angle (BA) | 25±2.5° |
| Side Angle (SA) | 17.5±2.5° |
Cantilever 規(guī)格
| cantilever geometry | Triangular |
|---|---|
| K(Nom) | 18N/m |
| Frequency(Nom) | 1400KHz |
| length(Nom) | 27um |
| thickness(Nom) | 0.58um |
| cantilever material | Silicon Nitride |
| top layer back | 100 ±10 nm of Al |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
