• Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Rotated (Symmetric)
  • Number of Cantilevers: 1個(gè)懸臂
    F60KHz K4N/m L300um
AFM探針描述

適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers

適用的AFM機(jī)型:
DimensionIcon,DimensionXR

適用的Work Mode:
tapping or non-contact

適用的Application:
Mechanical Property Mapping

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry Rotated (Symmetric)
tip radius (Nom) 10nm
tip height 4-10um
Front Angle (FA) 15±2.5°
Back Angle (BA) 25±2.5°
Side Angle (SA) 22.5±2.5°
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 4N/m
Frequency(Nom) 60KHz
length(Nom) 300um
thickness(Nom) 4um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back 40 ±10 nm of Al
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比
探針型號(hào)對(duì)比
添加型號(hào)