AFM探針描述
適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
適用的Work Mode:
CAFM,EFM,Electrical Spectroscopy,KPFM,PFM,SCM,SSRM,TUNA
適用的Application:
Electrical
Coating 描述
cantilever Front side coating | Conductive Platinum |
---|---|
cantilever Back side coating | Reflective Aluminum |
tip coating | Conductive Platinum |
Tip 規(guī)格
tip geometry | Visible Apex |
---|---|
tip radius (Nom) | 15nm |
tip height | 9-19um |
Front Angle (FA) | 0±1° |
Back Angle (BA) | 35 ±1° |
side Angle (SA) | 18 ±1° |
Cantilever 規(guī)格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 2N/m |
Frequency(Nom) | 70KHz |
length(Nom) | 240um |
thickness(Nom) | 2.3um |
cantilever material | 0.01 - 0.02 Ωcm Silicon |
top layer back | 100nm of Al |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum