RTESPA-525-30
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Rotated (Symmetric)
  • Number of Cantilevers: 1個(gè)懸臂
    F525KHz K200N/m L125um
AFM探針描述

適用的Sample:
Ceramics,Data Storage,Other Hard Samples,Semiconductors

適用的AFM機(jī)型:
DimensionIcon,DimensionXR

適用的Work Mode:
PeakForce QNM,PeakForce QNM High-Accuracy,tapping or non-contact

適用的Application:
General Topography,Mechanical Property Mapping

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry Rotated (Symmetric)
tip radius (Nom) 30nm
tip height 10-15um
Front Angle (FA) 15±2°
Back Angle (BA) 25±2°
Side Angle (SA) 17.5±2°
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 200N/m
Frequency(Nom) 525KHz
length(Nom) 125um
thickness(Nom) 5.75um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比
探針型號(hào)對(duì)比
開始對(duì)比 最多4個(gè)
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