SAA-HPI-30
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Rotated
  • Number of Cantilevers: 1個懸臂
    F55KHz K0.25N/m L110um
AFM探針描述

適用的Sample:
Bio Molecules,Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors

適用的AFM機型:
DimensionIcon,DimensionXR

適用的Work Mode:
PeakForce QNM,PeakForce QNM High-Accuracy,peakforce tapping,ScanAsyst

適用的Application:
General Topography,Mechanical Property Mapping

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry Rotated
tip radius (Nom) 30nm
tip height 3-8um
Front Angle (FA) 15°
Back Angle (BA) 25°
Cantilever 規(guī)格
cantilever geometry Special
K(Nom) 0.25N/m
Frequency(Nom) 55KHz
length(Nom) 110um
thickness(Nom) 0.58um
cantilever material Silicon Nitride
top layer back --
最新產品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對比
探針型號對比
添加型號
開始對比 最多4個
清空