TESPA-HAR
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: High Aspect Ratio
  • Number of Cantilevers: 1個懸臂
    F320KHz K42N/m L125um
AFM探針描述

適用的Sample:
Other Hard Samples,Semiconductors

適用的AFM機型:
DimensionIcon,DimensionXR,Non-Bruker

適用的Work Mode:
tapping or non-contact

適用的Application:
Holes/ Trenches

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry High Aspect Ratio
tip radius (Nom) 10nm
tip height 10-15um
Front Angle (FA) 5±1°
Back Angle (BA) 5±1°
Side Angle (SA) 5±1°
Spike Height 4500nm
Spike Width 200nm
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 42N/m
Frequency(Nom) 320KHz
length(Nom) 125um
thickness(Nom) 4um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back 45±5 nm of Al
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對比
探針型號對比
開始對比 最多4個
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