AFM探針描述
Nano Thermal Analysis probes, 300μm Length
適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample
適用的AFM機型:
DimensionIcon,DimensionXR
適用的Work Mode:
NanoScale TA
適用的Application:
Coating 描述
| tip coating | -- |
|---|
Tip 規(guī)格
| tip geometry | Standard (Steep) |
|---|---|
| tip radius (Nom) | <30nm |
| tip height | 3-6um |
Cantilever 規(guī)格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | |
| Frequency(Nom) | |
| length(Nom) | 300um |
| thickness(Nom) | -- |
| cantilever material | Silicon |
| top layer back | -- |
最新產品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
