AFM探針

高分辨率 AFM用于具有挑戰(zhàn)性的前沿研究

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Spring Constant
Resonance Frequency
Cantilever Length
Cantilever Geometry
Cantilever Coating
Cantilever Material
Tip Radius(Nom)
Tip Geometry
Tip Coating
Tip Height
Number Of Cantilevers
Sample
Afm
Work Mode
Application
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Frequency
Nom: 55KHz
Spring Const.
Nom: 0.25N/m
Geometry
Special
Tip Radius
1nm
Material
Silicon Nitride
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 0.4N/m
Geometry
Triangular
Tip Radius
2nm
Material
Silicon Nitride
Coating
B: Reflective Aluminum
Frequency
Nom: 55KHz
Spring Const.
Nom: 0.25N/m
Geometry
Special
Tip Radius
2nm
Material
Silicon Nitride
Coating
B: Reflective Aluminum
Frequency
Nom: 130KHz
Spring Const.
Nom: 0.4N/m
Geometry
Special
Tip Radius
2nm
Material
Silicon Nitride
Coating
B: Reflective Aluminum
Frequency
Nom: 150KHz
Spring Const.
Nom: 0.7N/m
Geometry
Triangular
Tip Radius
20nm
Material
Silicon Nitride
Coating
B: Reflective Gold
Frequency
Nom: 150KHz
Spring Const.
Nom: 0.7N/m
Geometry
Triangular
Tip Radius
2nm
Material
Silicon Nitride
Coating
B: Reflective Gold
Frequency
Nom: 10KHz
Spring Const.
Nom: 0.1N/m
Geometry
Rectangular
Tip Radius
25nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective PtIr,F: Conductive PtIr
Frequency
Nom: 75KHz
Spring Const.
Nom: 3N/m
Geometry
Rectangular
Tip Radius
25nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective PtIr,F: Conductive PtIr
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
15nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Al,F: Conductive PtSi
探針對(duì)比
探針型號(hào)對(duì)比
添加型號(hào)
開始對(duì)比 最多4個(gè)
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