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AFM探針
高分辨率 AFM用于具有挑戰(zhàn)性的前沿研究
篩選探針
篩選
清空
Spring Constant
<0.1N/m (30)
0.1-1N/m (75)
1.1-5N/m (46)
5.1-20N/m (9)
20.1-50N/m (73)
50.1-200N/m (7)
>200N/m (7)
Resonance Frequency
5KHz (1)
7KHz (12)
8KHz (1)
9KHz (1)
10KHz (5)
11KHz (2)
13KHz (10)
15KHz (12)
18KHz (17)
19KHz (1)
20KHz (5)
22KHz (13)
23KHz (13)
24KHz (2)
25KHz (0)
34KHz (2)
37KHz (1)
38KHz (12)
40KHz (10)
42KHz (1)
50KHz (1)
55KHz (4)
56KHz (13)
60KHz (3)
65KHz (15)
70KHz (12)
71KHz (3)
73KHz (2)
75KHz (23)
77KHz (1)
100KHz (2)
105KHz (1)
110KHz (3)
125KHz (12)
130KHz (3)
150KHz (8)
165KHz (1)
180KHz (2)
190KHz (11)
280KHz (1)
292KHz (13)
293KHz (3)
300KHz (13)
320KHz (31)
350KHz (4)
450KHz (2)
525KHz (5)
1400KHz (1)
Cantilever Length
16um (2)
27um (1)
30um (1)
36um (3)
38um (1)
42um (2)
60um (4)
70um (2)
75um (2)
85um (10)
97um (3)
100um (5)
110um (4)
115um (4)
117um (6)
120um (11)
123um (4)
125um (57)
130um (2)
140um (10)
150um (7)
160um (1)
170um (2)
175um (11)
197um (3)
200um (11)
205um (11)
210um (10)
215um (2)
225um (49)
230um (5)
240um (2)
300um (13)
305um (1)
310um (10)
350um (6)
397um (3)
400um (2)
450um (25)
465um (1)
Cantilever Geometry
Rectangular (173)
Rectangular & Triangular (12)
Special (22)
Triangular (26)
Cantilever Coating
40 ± 10nm of Al (1)
B: Drift Compensated Reflective Gold (1)
B: Proprietary reflective coating (3)
B: Reflective Al (1)
B: Reflective Aluminum (93)
B: Reflective Au (7)
B: Reflective CoCr (7)
B: Reflective Gold (31)
B: Reflective PtIr (5)
B: TiW/Au (500) (2)
F: Conductive Diamond (4)
F: Conductive Platinum (1)
F: Conductive PtIr (5)
F: Conductive PtSi (1)
F: Diamond-Like Carbon (2)
F: Gold (3)
F: Magnetic CoCr (8)
F: Wear resistant carbon (5)
Cantilever Material
0.01 - 0.02 Ωcm Antimony (n) doped Si (1)
0.01 - 0.02 Ωcm Silicon (3)
0.01 - 0.025 Ωcm Antimony (n) doped Si (119)
0.01 - 0.02Ωcm Antimony (n) doped Si (1)
0.010 - 0.025 Ωcm Silicon (14)
1 Ωcm Silicon (3)
Electrochemically Etched Wire (1)
Nickel (1)
Precision Cut Wire (1)
Silicon (9)
Silicon Nitride (51)
Single Crystal Diamond (4)
Solid Platinum (4)
Stainless Steel (7)
Tip Radius(Nom)
*1nm typical electrical resolution. (1)
<100nm (3)
<20nm (4)
<30nm (6)
<5nm (2)
10 ± 5nm (2)
100nm (4)
10nm (29)
15nm (6)
18nm (2)
1nm (5)
20nm (14)
25nm (7)
2nm (10)
30nm (8)
35nm (3)
40nm (8)
50 ± 10nm (2)
50nm (1)
5nm (9)
7nm (7)
80nm (1)
8nm (65)
Tip Geometry
Conical (5)
Critical Dimension (Overhang) (14)
High Aspect Ratio (19)
Pyramid (7)
Pyramidal (2)
Rotated (13)
Rotated (Symmetric) (85)
Solid Wire (14)
Standard (5)
Standard (Steep) (46)
Super Sharp (2)
Tipless (7)
Visible Apex (13)
Tip Coating
Amorphous Carbon (3)
Carbon Coated (2)
Conductive Diamond (4)
Conductive Platinum (1)
Conductive PtIr (1)
Conductive PtSi (1)
Diamond-Like Carbon (2)
gold (3)
Hand-crafted natural diamond Nanoindenting tip (7)
Highly conductive single crystal diamond (4)
Magnetic (8)
no tip coating (0)
Platinum/ Iridium (1)
PtIr (2)
TiW (2)
Tip Height
1.5-4.5um (2)
10-15um (110)
10-20um (13)
10um (3)
12.5±2.5um (4)
12.5um (2)
14-16um (3)
2-5um (1)
2.5-3.5um (4)
2.5-4.5um (2)
2.5-8.0um (28)
3-6um (6)
3-8um (9)
4-10um (4)
4.5-5.5um (2)
5-10um (1)
5-7um (1)
50um (7)
5um (1)
7-11um (1)
8-15um (1)
9-12um (2)
9-19um (3)
約100um (4)
Number Of Cantilevers
1個(gè)懸臂 (198)
2個(gè)懸臂 (5)
3個(gè)懸臂 (4)
4個(gè)懸臂 (13)
6個(gè)懸臂 (12)
Sample
Bio Molecules (46)
Cells (35)
Ceramics (128)
Data Storage (76)
Other Hard Samples (145)
Other Soft Sample (139)
Polymers (139)
Semiconductors (102)
Afm
BioScopeResolve (14)
Data Storage (0)
DimensionFastScan (50)
DimensionIcon (185)
DimensionXR (180)
Innova (154)
Insight (62)
JPK (141)
MultiMode (150)
Non-Bruker (136)
Semiconductors (0)
Work Mode
AFM-nDMA (2)
CAFM (18)
contact (65)
contact resonance (3)
Critical Dimension (CD) AFM (15)
Deep Trench (DT) (8)
EFM (19)
Electrical Spectroscopy (15)
FAST SCAN (6)
Force spectroscopy (34)
HarmoniX (2)
KPFM (20)
LFM (8)
MFM (8)
Nanoindentation (11)
NanoScale TA (6)
PeakForce Deep Trench (3)
PeakForce QNM (25)
PeakForce QNM High-Accuracy (4)
peakforce tapping (63)
PeakForce TUNA (8)
PFM (19)
ScanAsyst (10)
SCM (13)
sMIM (2)
SSRM (10)
sthM (3)
STM (9)
tapping or non-contact (125)
TERS (2)
Torsional Resonance (TR) (13)
TUNA (14)
Application
Electrical (38)
Fluid Imaging (41)
General Topography (121)
Holes/ Trenches (42)
Mechanical Force Curves (70)
Mechanical Property Mapping (40)
nanoindenting/nanoscratching applications (1)
probe for calibration (2)
Pulling (35)
suitable for tip modification (8)
Ultra Hi-Res (17)
每頁顯示
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條記錄
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TESP-HAR
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
10nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESP-SS
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
2nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESP-SSW
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
2nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESP-V2
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 37N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
TESPA-HAR
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 42N/m
Geometry
Rectangular
Tip Radius
10nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESPA-V2
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 37N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESPAW-V2
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 37N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESPD
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 40N/m
Geometry
Rectangular
Tip Radius
18nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum,F: Diamond-Like Carbon
TESPDW
對(duì)比
Frequency
Nom
: 320KHz
Spring Const.
Nom
: 40N/m
Geometry
Rectangular
Tip Radius
18nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum,F: Diamond-Like Carbon
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探針對(duì)比
探針型號(hào)對(duì)比
添加型號(hào)
開始對(duì)比
最多4個(gè)
清空
